The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 19, 2020

Filed:

Nov. 30, 2017
Applicant:

Wuhan China Star Optoelectronics Semiconductor Display Technology Co., Ltd., Wuhan, Hubei, CN;

Inventor:

Ping Chen, Hubei, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/956 (2006.01); G02F 1/13 (2006.01); G01N 21/95 (2006.01);
U.S. Cl.
CPC ...
G01N 21/95684 (2013.01); G01N 21/95 (2013.01); G01N 2021/9513 (2013.01); G02F 1/1303 (2013.01);
Abstract

A monitoring method of a thimble base includes the following steps: arranging a reflective surface on a thimble head of a thimble base; arranging at least a light source and a receiver on the thimble base; establishing a reflection path between the thimble bases to project light onto the reflective surface of the thimble head of one of the thimble bases in the reflection path, so that light is reflected between the reflective surfaces and is finally reflected to the receiver. The disclosure also provides a monitoring apparatus of the thimble bases. The monitoring apparatus includes a carrying platform, thimble bases arranged in an array on the carrying platform, and at least one light projecting and receiving device. Compared with the prior art, the disclosure realizes real-time monitoring of the thimble bases, thereby avoiding the problem of fragmentation caused by deformation of the thimble bases.


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