The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 19, 2020
Filed:
Feb. 12, 2018
Fanuc Corporation, Yamanashi, JP;
Junichirou Yoshida, Yamanashi, JP;
Fumikazu Warashina, Yamanashi, JP;
FANUC CORPORATION, Yamanashi, JP;
Abstract
An apparatus capable of quickly constructing an operation program that causes an inspection system to carry out an operation for imaging the surface to be inspected. This apparatus includes a drawing acquisition section configured to acquire drawing data of the workpiece, a designation receiving section configured to accept designation of the surface to be inspected in the drawing data, a target position acquisition section configured to acquire, as a target position, a position of the movement mechanism when the workpiece and the imaging section are positioned such that the surface to be inspected is within a field of view of the imaging section, and a program generation section configured to generate an operation program for controlling a movement operation of the movement mechanism and an imaging operation of the imaging section on the basis of the target position.