The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 19, 2020

Filed:

Jul. 17, 2017
Applicant:

Nri R&d Patent Licensing, Llc, San Antonio, TX (US);

Inventors:

Lester F. Ludwig, San Antonio, TX (US);

Karen Hao, Arlington, MA (US);

Frank Hu, San Francisco, CA (US);

Alice Huang, Belle Mead, NJ (US);

Pooncharas Tipgunlakant, San Francisco, CA (US);

Assignee:

Other;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/05 (2006.01); G02B 21/06 (2006.01); G01N 15/14 (2006.01); G02B 21/36 (2006.01);
U.S. Cl.
CPC ...
G01N 21/05 (2013.01); G01N 15/1475 (2013.01); G02B 21/06 (2013.01); G02B 21/367 (2013.01); G01N 2021/058 (2013.01);
Abstract

A color optical tomography system with fluorescence capabilities includes a light emitting array having a plurality of light emitting elements, a sample module, and a light sensing array including a plurality of light sensing elements, wherein the light sensing array is configured to sense light emitted from the light emitting array which has passed through the sample module. Light emitting elements emitting in the visible and UV ranges can comprise light emitting diodes (LEDs), organic light emitting diodes (OLEDs), organic light emitting transistors (OLETs), and/or other optoelectronic devices. The light sensing array can comprise for example organic light sensing devices, photodiodes, phototransistors, a CMOS photodetector, and/or charge-coupled devices (CCI)s). The light emitting array and the light sensing array can he flat or curved. The collection of measurement values can he overspecified, and a generalized inverse operation can be used to provide a solution to a resulting overspecified system of equations.


Find Patent Forward Citations

Loading…