The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 19, 2020
Filed:
Aug. 17, 2017
Applicant:
Fraunhofer-gesellschaft Zur Foerderung Der Angewandten Forschung E.v., Munich, DE;
Inventors:
Karl Haberger, Martinsried, DE;
Katrin Moebius, Germering, DE;
Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 15/02 (2006.01); G01N 15/06 (2006.01); G01B 7/14 (2006.01); G01D 5/241 (2006.01); G01N 27/61 (2006.01); G01P 5/00 (2006.01); G01N 15/00 (2006.01); G01N 1/22 (2006.01);
U.S. Cl.
CPC ...
G01N 15/0266 (2013.01); G01B 7/14 (2013.01); G01D 5/2415 (2013.01); G01D 5/2417 (2013.01); G01N 15/0612 (2013.01); G01N 27/61 (2013.01); G01P 5/006 (2013.01); G01N 1/2202 (2013.01); G01N 2015/0046 (2013.01);
Abstract
A measuring arrangement includes an electrostatic concentrator, a surface and an imaging sensor which are configured to detect particles.
Haberger, Karl. (2020). Measuring arrangement and method of directing and detecting particles (U.S. Patent No. 10656067). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10656067
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile