The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 19, 2020
Filed:
Apr. 18, 2017
Applicant:
Soundchip SA, Aran-Villette, CH;
Inventors:
Paul Darlington, Aran-Villette, CH;
Ben Skelton, Aran-Villette, CH;
Assignee:
SOUNDCHIP SA, Aran-Villette, CH;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04R 25/00 (2006.01); H04R 29/00 (2006.01); E21B 43/12 (2006.01); H04R 1/10 (2006.01); F04B 47/12 (2006.01); F04B 53/12 (2006.01);
U.S. Cl.
CPC ...
E21B 43/127 (2013.01); F04B 47/12 (2013.01); F04B 53/125 (2013.01); H04R 1/1083 (2013.01); H04R 29/00 (2013.01);
Abstract
An earphone test system () includes a plurality of test stations () each operative to perform a function during testing of an earphone device () coupled thereto. During testing of earphone devices () coupled to the plurality of test stations () the earphone test system () is operative to expose each of the plurality of test stations () to a noise field generated by a common noise field source ().