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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 10654715 B1

PDFFull Text
Date of Patent:
May. 19, 2020

Filed:

Dec. 20, 2016

Integrated analysis devices and related fabrication methods and analysis techniques

Applicant:

Bionano Genomics, Inc., San Diego, CA (US);

Inventors:

Han Cao, San Diego, CA (US);

Michael David Austin, San Diego, CA (US);

Parikshit A. Deshpande, San Diego, CA (US);

Mark Kunkel, San Diego, CA (US);

Alexey Y. Sharonov, San Diego, CA (US);

Michael Kochersperger, San Diego, CA (US);

Assignee:

BIONANO GENOMICS, INC., San Diego, CA (US);

Attorney:

Sheppard, Mullin, Richter & Hampton LLP

Primary Examiner:

Lisa M Caputo

Assistant Examiner:

Alex T Devito

Int. Cl.
CPC ...
G01N 21/64 (2006.01); B81C 1/00 (2006.01); B01L 3/00 (2006.01); G01N 21/03 (2006.01);
U.S. Cl.
CPC ...
B81C 1/00119 (2013.01); B01L 3/502761 (2013.01); B01L 2200/0663 (2013.01); B01L 2200/0689 (2013.01); B01L 2200/10 (2013.01); B01L 2300/0816 (2013.01); B01L 2300/0851 (2013.01); B01L 2300/0858 (2013.01); B01L 2300/0864 (2013.01); B01L 2300/0887 (2013.01); B01L 2300/168 (2013.01); B01L 2400/043 (2013.01); B01L 2400/0415 (2013.01); B01L 2400/0442 (2013.01); B01L 2400/0487 (2013.01); B01L 2400/086 (2013.01); B81B 2201/058 (2013.01); B81C 2201/019 (2013.01); G01N 2021/0346 (2013.01); G01N 2021/6439 (2013.01); Y10T 29/4981 (2015.01);
Abstract

Provided are integrated analysis devices having features of macroscale and nanoscale dimensions, and devices that have reduced background signals and that reduce quenching of fluorophores disposed within the devices. Related methods of manufacturing these devices and of using these devices are also provided.

Find Patent Forward Citations

Cao, Han. (2020). Integrated analysis devices and related fabrication methods and analysis techniques (U.S. Patent No. 10654715). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10654715

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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