The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 19, 2020
Filed:
Dec. 14, 2016
Applicant:
Dentsply Sirona Inc., York, PA (US);
Inventor:
Ciamak Abkai, Heddesheim, DE;
Assignee:
DENTSPLY SIRONA INC., York, PA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); A61B 6/00 (2006.01); G06T 11/00 (2006.01); A61B 5/00 (2006.01); A61B 6/02 (2006.01); A61B 6/14 (2006.01); A61C 9/00 (2006.01);
U.S. Cl.
CPC ...
A61B 6/582 (2013.01); A61B 5/0073 (2013.01); A61B 6/02 (2013.01); A61B 6/14 (2013.01); A61B 6/5247 (2013.01); A61C 9/0053 (2013.01); G06T 11/005 (2013.01); A61B 5/4547 (2013.01); A61B 5/725 (2013.01); A61B 2505/05 (2013.01); A61B 2576/02 (2013.01); G06T 2210/41 (2013.01);
Abstract
Disclosed is a method for calibrating at least one 2D X-ray image of an object to be imaged, which is recorded by an X-ray device in that X-rays produced by an X-ray source radiate through the object and are recorded by an X-ray detector. An already existing 3D model of a structure of the object is compared to the 2D X-ray image, wherein an actual image positional relationship of the X-ray source and the X-ray detector relative to the object, and/or relative to one another, is determined for the 2D X-ray image.