The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 19, 2020

Filed:

Nov. 07, 2016
Applicant:

Fujifilm Corporation, Tokyo, JP;

Inventors:

Takuro Asaoka, Kanagawa, JP;

Yoshihiro Ueda, Kanagawa, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 1/00 (2006.01); A61B 1/005 (2006.01);
U.S. Cl.
CPC ...
A61B 1/0052 (2013.01); A61B 1/0055 (2013.01); A61B 1/0057 (2013.01);
Abstract

Provided are an endoscope and a hardness adjustment device configured so that an arrangement space of built-in components in an operation portion can be ensured and that burden on a coil spring and a wire can be reduced. In an operation portion, a retained portion of a coil spring unit is retained at a first radial position by a coil spring holder as a first retainer, and a base end portion of a wire unit is retained at a second radial position by a wire holder as a second retainer. A base end portion of the coil spring unit is retained at a third radial position by a coil spring contact portion as a third retainer.


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