The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 12, 2020

Filed:

Jun. 13, 2017
Applicant:

Baicells Technologies Co. Ltd., Beijing, CN;

Inventors:

Yang Lu, Beijing, CN;

Lixin Sun, Beijing, CN;

Yingzhe Ding, Beijing, CN;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04W 24/10 (2009.01); H04W 36/00 (2009.01);
U.S. Cl.
CPC ...
H04W 36/0094 (2013.01); H04W 24/10 (2013.01);
Abstract

A method for distinguishing a measurement object, a base station and a UE are provided. The method includes: in case of determining to configure the UE to perform measurement to a neighboring cell, generating measurement configuration for the neighboring cell, wherein the measurement configuration includes a measurement object configuration IE and a measurement report configuration IE, and the measurement object configuration IE or a combination of the measurement object configuration IE and the measurement report configuration IE is used to indicate a RAT type of the measurement configuration; transmitting the measurement configuration to the UE so as to instruct the UE to perform measurement to a measurement object indicated in the measurement configuration; and receiving a measurement result message transmitted by the UE through a measurement result report IE after the UE performs the measurement to the measurement object.


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