The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 12, 2020
Filed:
Jun. 27, 2018
Fujitsu Limited, Kawasaki-shi, Kanagawa, JP;
Tatsuya Kikuzuki, Sodegaura, JP;
Shiho Nakahara, Nerima, JP;
Akihiro Wada, Kawasaki, JP;
Hiromasa Yamauchi, Kawasaki, JP;
Makoto Hamaminato, Kawasaki, JP;
Teruhisa Ninomiya, Yokohama, JP;
FUJITSU LIMITED, Kawasaki, JP;
Abstract
There is provided a radio wave interference analysis apparatus configured to analyze a state of interference due to a plurality of interference signals of a plurality of interference sources on a target signal of a wireless device as an evaluation target at a reception point, the radio wave interference analysis apparatus including a memory, and a processor coupled to the memory and the processor configured to calculate a first probability of failure of reception of the target signal at the reception point due to collision of the target signal with an interference signal of the plurality of interference signals, calculate a second probability of failure of reception of the target signal at the reception point due to the interference signal of the plurality of interference sources, and output the first probability and the second probability.