The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 12, 2020

Filed:

Oct. 22, 2019
Applicant:

Microsoft Technology Licensing, Llc, Redmond, WA (US);

Inventors:

Raymond Kirk Price, Redmond, WA (US);

Michael Bleyer, Seattle, WA (US);

Jian Zhao, Kenmore, WA (US);

Ravi Kiran Nalla, San Jose, CA (US);

Denis Demandolx, Bellevue, WA (US);

Zhiqiang Liu, Redmond, WA (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H04N 5/232 (2006.01); H04N 13/207 (2018.01); G02B 5/20 (2006.01); H04N 5/225 (2006.01); H04N 13/271 (2018.01); H04N 13/239 (2018.01); H04N 5/235 (2006.01); H04N 5/222 (2006.01); H04N 13/254 (2018.01); H04N 13/00 (2018.01);
U.S. Cl.
CPC ...
H04N 5/23296 (2013.01); G02B 5/208 (2013.01); H04N 5/2226 (2013.01); H04N 5/2254 (2013.01); H04N 5/2256 (2013.01); H04N 5/2258 (2013.01); H04N 5/2354 (2013.01); H04N 13/207 (2018.05); H04N 13/239 (2018.05); H04N 13/254 (2018.05); H04N 13/271 (2018.05); G06T 2200/04 (2013.01); G06T 2207/10028 (2013.01); G06T 2207/30252 (2013.01); H04N 2013/0081 (2013.01);
Abstract

A method for three-dimensional imaging includes emitting an output light with a structured light illuminator in a structured light pattern, receiving a trigger command, changing a field of illumination of the illuminator, and changing a field of view of an imaging sensor. The field of view and the field of illumination are linked, such that the field of view of the imaging sensor is the same as the field of illumination of the illuminator at a short throw field of view and a long throw field of view. The method further includes detecting a reflected light with the imaging sensor and measuring a depth value by calculating a distortion of the structured light pattern.


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