The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 12, 2020
Filed:
Nov. 01, 2016
Nec Corporation, Minato-ku, Tokyo, JP;
Natsuki Kai, Tokyo, JP;
NEC CORPORATION, Tokyo, JP;
Abstract
In order to enable to measure a throughput with high accuracy in an application layer, a throughput measuring method according to an exemplary aspect of the invention includes: transmitting data to a receiving device, receiving a feedback indicating a receiving completion of the data, from the receiving device, calculating a boundary value of a range of values allowable for a throughput, based on the feedback and a transmitted data amount of the data, measuring a theoretical value of the throughput, and outputting the boundary value when the theoretical value falls outside the range, and outputting the theoretical value when the theoretical value falls within the range.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile