The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 12, 2020

Filed:

Dec. 14, 2017
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Phillip John Restle, Katonah, NY (US);

Christos Vezyrtzis, New Rochelle, NY (US);

James Douglas Warnock, Somers, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04L 7/00 (2006.01); G06F 1/14 (2006.01); G06F 1/06 (2006.01); G06F 1/12 (2006.01);
U.S. Cl.
CPC ...
H04L 7/0008 (2013.01); G06F 1/06 (2013.01); G06F 1/12 (2013.01); G06F 1/14 (2013.01);
Abstract

Techniques for determining the quality of a clock signal are provided. In one example, a method can comprise comparing, by a sensory circuitry of a system, a first output of a first sensor and a second output of a second sensor. The first output and the second output can be based on a parameter of a clock signal. Further, in some embodiments, the first sensor and the second sensor can be local clock buffers. The method can also comprise determining, by a controller of the system, a quality of the clock signal based on the comparing of the first output and the second output.


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