The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 12, 2020

Filed:

Apr. 04, 2016
Applicant:

Palantir Technologies Inc., Palo Alto, CA (US);

Inventors:

Julie Noelle Tibshirani, Menlo Park, CA (US);

Ryan Amelia Beiermeister, Washington, DC (US);

Daniel Patrick Cervelli, Mountain View, CA (US);

Timothy James Slatcher, Hampshire, GB;

Gregory DeJuan Martin, Royal Oak, MI (US);

Antoine Alexandre Adrien Llorca, San Francisco, CA (US);

Timothy James Wilson, Palo Alto, CA (US);

Assignee:

Palantir Technologies Inc., Palo Alto, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 11/20 (2006.01); G06Q 40/00 (2012.01); G06Q 50/22 (2018.01);
U.S. Cl.
CPC ...
G06T 11/206 (2013.01); G06Q 40/00 (2013.01); G06Q 50/22 (2013.01);
Abstract

A method and system for drawing a stack graph that includes a timeline and one or more stack lines based on a set of event data. A stack line may be associated with an event target and may include one or more event overlays that represent event objects. In one implementation, event overlays may include a visual characteristic that identifies an event source associated with the event object of the event overlay.


Find Patent Forward Citations

Loading…