The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 12, 2020
Filed:
Jul. 20, 2016
Baidu Usa, Llc, Sunnyvale, CA (US);
Yusheng Xie, Campbell, CA (US);
Nan Du, Palo Alto, CA (US);
Jing Zhai, Mountain View, CA (US);
Weicheng Zhu, Sunnyvale, CA (US);
Dawen Zhou, Fremont, CA (US);
Wei Fan, Sunnyvale, CA (US);
Baidu USA LLC, Sunnyvale, CA (US);
Abstract
Systems and methods are disclosed for question generation to infer the most probable cause from the observable outcome and known Noisy-OR causal relations. In embodiments, the outcomes are sorted by indices according to an order including but not limited to the outcomes' natural frequency order, expert-labeled order, machine-learning derived order, etc. According to their assigned indices, in embodiments, observed outcomes with lower indices are assigned for exact inference while observed outcomes with higher indices are assigned for variational inference. In embodiments, results of exact inference and variational inference are combined to predict the most probable cause. The unique combination of exact inference and variational inference according to outcome indices makes the probable cause inferring process faster.