The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 12, 2020
Filed:
Sep. 28, 2018
Hand Held Products, Inc., Fort Mill, SC (US);
Alain Gillet, Galan, FR;
Jean-Luc Basso, Montbrun-lauragais, FR;
Hand Held Products, Inc., Fort Mill, SC (US);
Abstract
Various embodiments described herein relates to indicia reading system for scanning and decoding direct part markings (DPM) indicia. The indicia reading system includes a plurality of collimating optical elements that generate collimated light beams. A plurality of diffractive optical elements is tuned to split a corresponding collimated light beam into at least two sets of refracted light beams at two incident angles relative to a DPM indicia. A first set of refracted light beams with a zero-diffraction order and a first incident angle causes a bright-field illumination in a far-field area. A second set of refracted light beams with a first-diffraction order and a second incident angle causes a dark-field illumination in a near-field area. An image sensor generates image data of the DPM indicia based on a set of reflected light beams received from the DPM indicia in accordance with one of the bright-field illumination or the dark-field illumination.