The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 12, 2020
Filed:
Nov. 21, 2018
Konica Minolta Laboratory U.s.a., Inc., San Mateo, CA (US);
Kazuto Yamamoto, Foster City, CA (US);
Randy Cruz Soriano, San Leandro, CA (US);
KONICA MINOLTA LABORATORY U.S.A., INC., San Mateo, CA (US);
Abstract
Tamper detection on an article is performed by reading data from an RFID tag having an antenna with segments designed to break apart. The RFID tag is secured to the article in such a way that, when the article is tampered with, the antenna segments will break apart. Detachment would decrease the reading range of the RFID tag. An RFID reader may be used to read the data from the RFID tag. The predefined reading range (Rp) of the RFID tag, with antenna segments entact, is obtained from the data which was read by the RFID reader. The RFID reader obtains the data while located at an actual reading range (Ra) relative to the RFID tag. By comparing Ra with Rp, it is determined whether the antenna is still entact. If Ra<Rp, the antenna is likely to be broken apart, thereby indicating that the article has been tampered with.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile