The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 12, 2020

Filed:

Feb. 28, 2018
Applicants:

Sasith Maduranga Rajasooriya, Franklin, OH (US);

Chris Peter Tsokos, Tampa, FL (US);

Pubudu Kalpani K Hitigala Kaluarachchilage, Franklin, OH (US);

Inventors:

Sasith Maduranga Rajasooriya, Franklin, OH (US);

Chris Peter Tsokos, Tampa, FL (US);

Pubudu Kalpani K Hitigala Kaluarachchilage, Franklin, OH (US);

Assignee:

University of South Florida, Tampa, FL (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 21/57 (2013.01); G06N 7/00 (2006.01);
U.S. Cl.
CPC ...
G06F 21/577 (2013.01); G06N 7/005 (2013.01); G06F 2221/034 (2013.01);
Abstract

According to the embodiments, a statistical model is developed to estimate the probability of being in a certain stage of a particular vulnerability in its life cycle. The methodology with the application of Markov chain theory gives the basis for calculating estimates for probabilities for different stages of a life cycle of the vulnerability considered. Using the developed method, it is possible to evaluate the risk level of a particular vulnerability at a certain time. These developments allow an advantage in taking measures to avoid exploitations and introduce patches for the vulnerability before an attacker takes the advantage of that particular vulnerability.


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