The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 12, 2020
Filed:
Dec. 12, 2016
Splunk Inc., San Francisco, CA (US);
Leonid Viktorovich Alekseyev, San Francisco, CA (US);
Brian John Bingham, Castle Rock, CO (US);
Tristan Antonio Fletcher, Pacifica, CA (US);
Brian C. Reyes, Seattle, WA (US);
Splunk Inc., San Francisco, CA (US);
Abstract
Raw machine data are captured and may be organized as events. Entity definitions representing machine entities that perform a service identify the machine data pertaining to respective entities. KPI search queries each define a KPI. Each KPI search query derives one or more values for the KPI from machine data identified in the entity definitions. The derivation may be performed on a per-entity basis and on the aggregate. The derived values may then be translated into a state value domain using per-entity thresholds, aggregate thresholds, or a combination.