The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 12, 2020

Filed:

Sep. 27, 2018
Applicant:

Microchip Technology Incorporated, Chandler, AZ (US);

Inventors:

Kevin Kilzer, Chandler, AZ (US);

Aditya Nukala, Gilbert, AZ (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 1/04 (2006.01); G06F 11/16 (2006.01); G06F 1/14 (2006.01); G06F 1/10 (2006.01); G06F 1/08 (2006.01);
U.S. Cl.
CPC ...
G06F 1/14 (2013.01); G06F 1/04 (2013.01); G06F 1/08 (2013.01); G06F 1/10 (2013.01); G06F 11/1604 (2013.01);
Abstract

A system for testing a clock monitor includes a fault injection circuit, a control circuit, and a clock monitor circuit to evaluate a clock source signal from a clock source. The fault injection circuit is to modify or replace the clock source signal from the clock source to yield a modified clock signal, and send the modified clock signal to the clock monitor circuit. The clock monitor circuit is to receive an input clock signal, determine whether the input clock signal indicates a faulty clock source, and issue a clock corrective action if the input clock signal indicates a faulty clock source. The control circuit is to monitor for the clock corrective action, and determine, based on whether the clock corrective action is issued, whether the clock monitor circuit is operating correctly.


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