The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 12, 2020

Filed:

Sep. 23, 2016
Applicant:

Fisher-rosemount Systems, Inc., Round Rock, TX (US);

Inventors:

Noel Howard Bell, Austin, TX (US);

Mark John Nixon, Round Rock, TX (US);

Alper Turhan Enver, Austin, TX (US);

Joshua Brian Kidd, Safety Harbor, FL (US);

Paul R. Muston, Narborough, GB;

Assignee:

FISHER-ROSEMOUNT SYSTEMS, INC., Round Rock, TX (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G05B 23/02 (2006.01);
U.S. Cl.
CPC ...
G05B 23/0275 (2013.01); G05B 23/024 (2013.01); G05B 2219/31356 (2013.01); Y02P 90/02 (2015.11);
Abstract

A technique is provided for providing early fault detection using process control data generated by control devices in a process plant. The technique determines a leading indicator of a condition within the process plant, such as a fault, abnormality, or decrease in performance. The leading indicator may be determined using principal component analysis. A process signal indicating a process variable corresponding to the leading indicator is then obtained and analyzed. A rolling fast Fourier transform (FFT) may be performed on the process signal to generate time-series data with which to monitor the process plant. When the presence of the leading indicator is detected in the time-series data, an alert or other prediction of the condition may be generated. Thus, process faults may be identified using fluctuations and abnormalities as leading predictors.


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