The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 12, 2020

Filed:

Jan. 17, 2018
Applicant:

Witec Wissenschaftliche Instrumente Und Technologie Gmbh, Ulm, DE;

Inventors:

Olaf Hollricher, Neu-Ulm, DE;

Wolfram Ibach, Ulm-Lehr, DE;

Peter Spizig, Ulm, DE;

Detlef Sanchen, Blaustein, DE;

Gerhard Volswinkler, Laupheim, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/00 (2006.01); G02B 21/36 (2006.01); G02F 1/29 (2006.01); G01N 21/65 (2006.01); G01N 21/64 (2006.01); G01B 11/24 (2006.01); G01B 9/04 (2006.01);
U.S. Cl.
CPC ...
G02B 21/006 (2013.01); G01B 9/04 (2013.01); G01B 11/24 (2013.01); G01N 21/6458 (2013.01); G01N 21/65 (2013.01); G02B 21/0032 (2013.01); G02B 21/0064 (2013.01); G02B 21/36 (2013.01); G02F 1/29 (2013.01); G01N 2021/6478 (2013.01); G01N 2201/06113 (2013.01);
Abstract

A device for imaging the surfaces of a sample having topography with the aid of confocal microscopy, in particular confocal Raman and/or fluorescence microscopy, comprising a first light source, in particular a laser light source for generating excitation radiation, in particular Raman radiation and/or fluorescence radiation and a second light source, wherein the first laser light source emits radiation in a first wavelength range and the second light source emits radiation in a second wavelength range, wherein the first wavelength range and the second wavelength range do not overlap.


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