The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 12, 2020
Filed:
Dec. 27, 2017
Applicant:
Sysmex Corporation, Kobe-shi, Hyogo, JP;
Inventors:
Assignee:
SYSMEX CORPORATION, Kobe-shi, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 35/10 (2006.01); G01N 15/14 (2006.01); G01N 35/00 (2006.01); G01N 15/00 (2006.01); G01N 15/10 (2006.01);
U.S. Cl.
CPC ...
G01N 35/1009 (2013.01); G01N 15/1425 (2013.01); G01N 35/1002 (2013.01); G01N 35/1004 (2013.01); G01N 35/1095 (2013.01); G01N 15/1404 (2013.01); G01N 2015/008 (2013.01); G01N 2015/1006 (2013.01); G01N 2015/1486 (2013.01); G01N 2035/00465 (2013.01);
Abstract
A specimen measurement apparatus may include: an aspirator via which a specimen is aspirated. A flow path may be connected to the aspirator. A first pump may be connected to the flow path. A second pump may be connected to the flow path. A controller may select and cause either the first pump or the second pump to aspirate the specimen via the aspirator.