The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 12, 2020

Filed:

Jan. 17, 2019
Applicants:

Donggyu Kim, Cambridge, MA (US);

Dirk Robert Englund, Brookline, MA (US);

Inventors:

Donggyu Kim, Cambridge, MA (US);

Dirk Robert Englund, Brookline, MA (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01V 3/00 (2006.01); G01N 24/00 (2006.01); G01Q 60/20 (2010.01); G02B 7/04 (2006.01); G01R 33/32 (2006.01); G01N 24/10 (2006.01);
U.S. Cl.
CPC ...
G01N 24/006 (2013.01); G01Q 60/20 (2013.01); G02B 7/04 (2013.01); G01N 24/10 (2013.01); G01R 33/323 (2013.01);
Abstract

A method includes applying, to a sample exhibiting optical scattering and having a emission particles distributed therein that exhibit spin-dependent fluorescence, a magnetic field to shift a resonance frequency of each emission particle in a position-dependent manner. The method also includes exciting the sample with an excitation beam that causes at least one emission particle to emit spin-dependent fluorescence and detecting the emitted spin-dependent fluorescence. The method also includes estimating a position of the emission particle(s) within the sample based on the spin-dependent fluorescence, the resonance frequency, and the magnetic field. The method also includes estimating optical transmission information for the sample based on a wavefront of the excitation beam and the estimated position. The optical transmission information including a measure of an optical field at each position of an emission particle.


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