The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 12, 2020
Filed:
Jul. 21, 2016
Kabushiki Kaisha Toshiba, Tokyo, JP;
Toshiba Infrastructure Systems & Solutions Corporation, Kawasaki-shi, Kanagawa, JP;
Yoko Yonekawa, Tokyo, JP;
Nobuyuki Kumakura, Kanagawa, JP;
Takahiko Yamazaki, Chiba, JP;
Shingo Yasunami, Chiba, JP;
Kabushiki Kaisha Toshiba, Tokyo, JP;
Toshiba Infrastructure Systems & Solutions Corporation, Kawasaki-shi, Kanagawa, JP;
Abstract
A crack analysis device includes a captured image acquiring unit, a crack detecting unit, and a crack ratio calculator. The captured image acquiring unit acquires a captured image which is obtained by imaging a road surface. The crack detecting unit detects cracks in the imaged road surface on the basis of the captured image. The crack ratio calculator calculates a crack ratio indicating a ratio of an area of the cracks to a predetermined area on the basis of the detected cracks.