The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 12, 2020
Filed:
Mar. 23, 2018
China University of Mining and Technology, Beijing, Beijing, CN;
Yang Ju, Beijing, CN;
Zhangyu Ren, Beijing, CN;
Li Wang, Beijing, CN;
Lingtao Mao, Beijing, CN;
Hongbin Liu, Beijing, CN;
CHINA UNIVERSITY OF MINING AND TECHNOLOGY, BEIJING, Beijing, CN;
Abstract
A method for measuring the dynamic stress field evolution law of a complex heterogeneous structure, comprising: preparing a transparent photosensitive resin model of a complex heterogeneous structure by means of three-dimensional (3D) printing technology to serve as a test piece (S); placing the test piece in a light path of a circularly polarized light dark field, performing continuous stress loading on the test piece, and recording images (S); acquiring a plurality of continuously changing full-field stress fringe grayscale images according to videos generated by the image recording (S); then acquiring grayscale value change sequences of pixel points at each position in the images (S); and finally, calculating full-field fringe orders under continuous loading conditions according to the relation between the grayscale values and the fringe orders so as to calculate full-field stress values under the continuous loading conditions (S). Thus, it is possible to extract and quantify the global dynamic stress field evolution law of a complex heterogeneous structure subjected to high exterior load under fixed light field conditions.