The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 12, 2020
Filed:
Jun. 19, 2017
University of the Witwatersrand, Johannesburg, Johannesburg, ZA;
Andrew Forbes, Johannesburg, ZA;
UNIVERSITY OF THE WITWATERSRAND, JOHANNESBURG, Johannesburg, ZA;
Abstract
This invention relates to a method of and a system for determining a beam quality factor (VQF) of a beam of light having a transverse electric field that may be scalar, vector, or a combination thereof, wherein the VQF is a measure of the degree of vectorness of the beam of light varying between pure scalar and pure vector. The beam is typically a laser beam, wherein the method comprises receiving an input laser beam to be analysed and splitting the received beam of light into two orthogonal components. A predetermined number of modes or states per orthogonal component is then detected and an on axis intensity of each detected mode or state detected is measured. The measured intensities is then used to calculate the VQF in terms using at least one quantum mechanical entanglement measure.