The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 12, 2020

Filed:

Feb. 26, 2018
Applicant:

Safran Vectronix Ag, Herbrugg, CH;

Inventor:

Silvio Gnepf, Heerbrugg, CH;

Assignee:

Safran Vectronix AG, Heerbrugg, CH;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01C 17/38 (2006.01); G01C 17/26 (2006.01);
U.S. Cl.
CPC ...
G01C 17/38 (2013.01); G01C 17/26 (2013.01);
Abstract

Optoelectronic measuring device having an electronic magnetic compass and a compensation device assigned to the magnetic compass for compensating device-fixed interference fields and is designed to occupy at least two defined, repeatable operating states and generates a different device-fixed interference field in each of the operating states. The measuring device is designed to occupy at least two defined, repeatable application states, the magnetic compass being exposed to a different external magnetic interference field in each of the application states. The compensation device being designed to measure a first, second and third magnetic field set in a first, second and third overall state of the measuring device, and to determine by means of the processing unit a first, second and third set of parameters based on the first, second and third magnetic field set respectively, and to derive a fourth parameter set based on the first, second and third parameter set.


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