The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 12, 2020
Filed:
Nov. 16, 2017
Applicant:
Quality Vision International, Inc., Rochester, NY (US);
Inventor:
Daniel James Lawler Williams, Rochester, NY (US);
Assignee:
QUALITY VISION INTERNATIONAL INC., Rochester, NY (US);
Primary Examiner:
Int. Cl.
CPC ...
G01B 11/14 (2006.01); G01B 9/02 (2006.01); G01B 11/24 (2006.01);
U.S. Cl.
CPC ...
G01B 11/2441 (2013.01); G01B 9/02017 (2013.01); G01B 9/02024 (2013.01); G01B 9/02091 (2013.01);
Abstract
An optical measuring system for a measuring machine includes at least two scanning devices for intermittently moving through alternately timed sequences of static measuring positions at which a measuring beam is directed to and from a test object. An optical switch selectively routes the measuring beam through any one of the scanning devices that has settled into one of the static measuring positions.