The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 12, 2020
Filed:
Sep. 25, 2017
Carl Zeiss Industrielle Messtechnik Gmbh, Oberkochen, DE;
Tobias Held, Noerdlingen, DE;
CARL ZEISS INDUSTRIELLE MESSTECHNIK GMBH, Oberkochen, DE;
Abstract
A measuring system having a measuring tool which includes a probe body and an optical marker, a camera for recording image data of the measuring tool, and an evaluation and control unit which is configured to evaluate the image data recorded by the camera and use the data to determine spatial position coordinates of the optical marker. The evaluation and control unit is also configured to calculate the deformation of the measuring tool due to external mechanical loading acting on the measuring tool, and to determine spatial position coordinates of the probe body based on the spatial position coordinates of the optical marker and the calculated deformation.