The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 12, 2020
Filed:
Oct. 21, 2016
Hewlett-packard Development Company, L.p., Spring, TX (US);
Peter Morovic, Sant Cugat del Valles, ES;
Jan Morovic, London, GB;
Jordi Arnabat Benedicto, Sant Cugat del Valles, ES;
Hector Gomez Minano, Sant Cugat del Valles, ES;
Hewlett-Packard Development Company, L.P., Spring, TX (US);
Abstract
An apparatus and method for use in generating calibration parameters for a printing apparatus comprising a plurality of print modules are disclosed. The method comprises printing a first plurality of test patches for each print module of the plurality of print modules, analysing the first plurality of test patches to identify at least two clusters of print modules, wherein each cluster comprises a sub-group of print modules having substantially similar performance, printing a second plurality of test patches comprising an extended calibration test patch set for each cluster of print modules, the second plurality of test patches being distributed across the print modules of the cluster, and analysing extended calibration test patch set for each cluster to determine a calibration parameter for the printing apparatus.