The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 12, 2020

Filed:

Feb. 09, 2018
Applicant:

General Electric Company, Schenectady, NY (US);

Inventors:

Otto Valtteri Pekander, Helsinki, FI;

Matti Huiku, Helsinki, FI;

Juha Virtanen, Helsinki, FI;

Assignee:

General Electric Company, Schenectady, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 5/1455 (2006.01); A61B 5/00 (2006.01); A61B 5/1495 (2006.01);
U.S. Cl.
CPC ...
A61B 5/14552 (2013.01); A61B 5/1495 (2013.01); A61B 5/7264 (2013.01);
Abstract

A reflective SpOmeasurement system includes a light source that emits light of at least a first and second wavelengths, and one or more detection devices forming a close detector positioned at a first distance from the light source and a far detector positioned at a second distance from the light source, wherein the second distance is greater than the first. The SpOmeasurement system is configured to operate in a high power mode to determine a calibration factor based on the comparison of light reflections detected by the close detector and the far detector. The system is further configured to operate in a low power mode to generate a low intensity light pulse, and detect a close reflection of the low intensity light pulse with the close detector. An SpOis then determined based on the close reflection of the low intensity light pulse and the calibration factor.


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