The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 12, 2020
Filed:
Apr. 22, 2016
Institut National DE LA Sante ET DE LA Recherche Medicale (Inserm), Paris, FR;
Universite Paris Diderot—paris 7, Paris, FR;
Assistance Publique-hopitaux DE Paris, Paris, FR;
Univesite DE Versailles Saint-quentin-en-yvelines, Versailles, FR;
INSTITUT NATIONAL DE LA SANTE ET DE LA RECHERCHE MEDICALE (INSERM), Paris, FR;
UNIVERSITE PARIS DIDEROT—PARIS 7, Paris, FR;
UNIVERSITE VERSAILLES SAINT-QUENTIN-EN-YVELINES, Versailles, FR;
ASSISTANCE PUBLIQUE-HOPITAUX DE PARIS (APHP), Paris, FR;
Abstract
It is proposed a method for post-processing images of an region of interest in a subject, the images being acquired with a magnetic resonance imaging technique, the method for post-processing comprising at least the step of: —unwrapping the phase of each image, —extracting a complex signal over echo time for at least one pixel of the unwrapped images, and —calculating fat characterization parameters by using a fitting technique applied on a model, the model being a function which associates to a plurality of parameters each extracted complex signal, the plurality of parameters comprising at least two fat characterization parameters, the magnitude error and the phase error generated by the use of the bipolar readout gradients, the fitting technique being a non-linear least-square fitting technique using pseudo-random initial conditions.