The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 05, 2020

Filed:

Sep. 13, 2017
Applicant:

Screen Holdings Co., Ltd., Kyoto-shi, Kyoto, JP;

Inventor:

Yoshio Ito, Kyoto, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H05B 3/00 (2006.01); H01L 21/687 (2006.01); G01J 5/60 (2006.01); G01J 5/08 (2006.01); G01J 5/00 (2006.01); H01L 21/67 (2006.01); H05B 1/02 (2006.01); G01J 5/04 (2006.01);
U.S. Cl.
CPC ...
H05B 3/0047 (2013.01); G01J 5/0007 (2013.01); G01J 5/0865 (2013.01); G01J 5/602 (2013.01); H01L 21/67115 (2013.01); H01L 21/67248 (2013.01); H01L 21/68707 (2013.01); H05B 1/0233 (2013.01); H05B 3/009 (2013.01); G01J 5/041 (2013.01); G01J 2005/0055 (2013.01); G01J 2005/604 (2013.01);
Abstract

An atmosphere of ammonia that absorbs infrared light in a wavelength band overlapping with the measurement wavelength band of a radiation thermometer is formed in a chamber in which a semiconductor wafer is thermally treated. A filter that selectively transmits infrared light having a wavelength not overlapping with the absorption wavelength band of ammonia is installed between an optical lens system and a detector of the radiation thermometer to avoid influence of the infrared light absorption by ammonia. A conversion table corresponding to the installed filter is selected from a plurality of conversion tables representing a correlation between energy of infrared light incident on the radiation thermometer and temperature of a black body, and is used at the radiation thermometer. Accordingly, the temperature of the semiconductor wafer can be accurately measured in the atmosphere of ammonia.


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