The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 05, 2020
Filed:
May. 04, 2018
Applicant:
Mediatek Inc., Hsinchu, TW;
Inventors:
Weidong Yang, San Diego, CA (US);
Bo-Si Chen, Hsinchu, TW;
Assignee:
MEDIATEK INC., Hsin-chu, TW;
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H04L 1/24 (2006.01); H04L 5/00 (2006.01); H04J 11/00 (2006.01); H04W 24/10 (2009.01); H04W 52/02 (2009.01); H04W 16/18 (2009.01);
U.S. Cl.
CPC ...
H04L 1/248 (2013.01); H04J 11/005 (2013.01); H04L 5/0053 (2013.01); H04W 16/18 (2013.01); H04L 5/0048 (2013.01); H04W 24/10 (2013.01); H04W 52/0203 (2013.01);
Abstract
Various solutions for cross-link interference measurements with respect to user equipment and network apparatus in mobile communications are described. A node of a wireless network may receive a cross-link interference (CLI) measurement configuration. The node may determine a measurement slot according to the CLI measurement configuration. The node may determine whether to perform a CLI measurement in the measurement slot according to the CLI measurement configuration. The node may receive a CLI reference signal (RS) in the measurement slot. The node may perform the CLI measurement in the measurement slot.