The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 05, 2020

Filed:

Nov. 30, 2017
Applicant:

Western Digital Technologies, Inc., San Jose, CA (US);

Inventors:

Divya Prasad, East Delhi, IN;

Sainath Viswasarai, Hyderabad, IN;

Gopu S, Trivandrum, IN;

Swaroop Kaza, Campbell, CA (US);

Piyush Anil Dhotre, Bengaluru, IN;

Chittoor Devarajan Sunilkumar, Bengaluru, IN;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 16/04 (2006.01); G11C 16/16 (2006.01); G11C 16/34 (2006.01); G06F 12/02 (2006.01); G11C 16/12 (2006.01);
U.S. Cl.
CPC ...
G11C 16/16 (2013.01); G06F 12/0246 (2013.01); G11C 16/0483 (2013.01); G11C 16/12 (2013.01); G11C 16/3409 (2013.01); G11C 16/3445 (2013.01);
Abstract

Apparatuses, systems, methods, and computer program products for enhanced erase retry of a non-volatile storage device are disclosed. An apparatus includes a non-volatile storage device and a controller. A controller includes a verification component configured to detect that an erase operation performed on an erase block of a non-volatile storage device is unsuccessful. A controller includes a parameter component configured to adjust one or more erase parameters for an erase operation. One or more erase parameters may be associated with one or more select gate drain storage cells of an erase block. A controller includes an erase component configured to retry an erase operation on an erase block with one or more adjusted erase parameters.


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