The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 05, 2020
Filed:
Mar. 21, 2016
Rensselaer Polytechnic Institute, Troy, NY (US);
Ge Wang, Loudonville, NY (US);
Mianyi Chen, Troy, NY (US);
Yan Xi, Syracuse, NY (US);
Wenxiang Cong, Albany, NY (US);
Rensselaer Polytechnic Institute, Troy, NY (US);
Abstract
Systems and methods for geometric calibration and image reconstruction in computed tomography (CT) scanning using iterative reconstruction algorithms are provided. An iterative reconstruction algorithm can be used to reconstruct an improved image, and then the improved image can be used to adjust inaccurate parameters by using a Locally Linear Embedding (LLE) method. Adjusted parameters can then be used to reconstruct new images, which can then be used to further adjust the parameters. The steps of this iterative process can be repeated until a quality threshold is met.