The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 05, 2020
Filed:
Jan. 30, 2015
Hewlett Packard Enterprise Development Lp, Houston, TX (US);
Gowtham Bellala, Palo Alto, CA (US);
Mi Zhang, Palo Alto, CA (US);
Geoff M. Lyon, Half Moon Bay, CA (US);
MICRO FOCUS LLC, Santa Clara, CA (US);
Abstract
Performance testing based on variable length segmentation and clustering of time series data is disclosed. One example is a system including a training module, a performance testing module, and an interface module. The training module generates a trained model to learn characteristics of a system of interest from training time series data by segmenting the training time series data into homogeneous windows of variable length, clustering the segments to identify patterns, and associating each cluster with a cluster score. The performance testing module analyzes system characteristics from testing time series data by receiving the testing time series data, and determining a performance metric for the testing time series data by analyzing the testing time series data based on the trained model. The interface module is communicatively linked to the performance testing module, and provides the performance metric via an interactive graphical user interface.