The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 05, 2020

Filed:

Feb. 02, 2018
Applicants:

Mamoru Komachi, Nishitokyo, JP;

Shin Kanouchi, Hino, JP;

Tomoya Ogata, Hidaka, JP;

Tomoya Takatani, Nissin, JP;

Inventors:

Mamoru Komachi, Nishitokyo, JP;

Shin Kanouchi, Hino, JP;

Tomoya Ogata, Hidaka, JP;

Tomoya Takatani, Nissin, JP;

Assignees:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/00 (2019.01); G06F 40/30 (2020.01); G06N 3/08 (2006.01); G06F 40/56 (2020.01); G06N 3/04 (2006.01);
U.S. Cl.
CPC ...
G06F 40/30 (2020.01); G06F 40/56 (2020.01); G06N 3/08 (2013.01); G06N 3/0445 (2013.01);
Abstract

An output sentence generation apparatus for automatically generating one output sentence from a plurality of input keywords includes a candidate sentence generator incorporating a learned neural network configured to take in the plurality of keywords and generate a plurality of candidate sentences each including at least some of the plurality of keywords, and an evaluation outputter configured to calculate an overlap ratio for each of the plurality of candidate sentences generated by the candidate sentence generator and increase an evaluation of the candidate sentence with a small overlap ratio to thereby determine an output sentence from the plurality of candidate sentences. The overlap ratio is the number of occurrences of an overlapping word with respect to the number of occurrences of all words included in the corresponding candidate sentence.


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