The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 05, 2020
Filed:
Oct. 23, 2013
Applicant:
New York University, New York, NY (US);
Inventors:
Assignee:
NEW YORK UNIVERSITY, New York, NY (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 17/50 (2006.01);
U.S. Cl.
CPC ...
G06F 17/5018 (2013.01);
Abstract
A system and methods for weak spot analysis. A mesh shape is preprocessed to approximate an input model for an object. The mesh shape is analyzed with modal analysis to identify weak regions. A method and system for determining weak spots in an object. The method and system uses an optimization problem which is solved to determine a pressure distribution on the object maximizing maximal principal stress by solving a set of optimization problems maximizing stress for each point of the object.