The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 05, 2020

Filed:

Apr. 01, 2015
Applicant:

Micro Focus Llc, Santa Clara, CA (US);

Inventors:

Yair Horovitz, Yehud, IL;

Maria Smolkov, Yehud, IL;

Nurit Peres, Yehud, IL;

Assignee:

MICRO FOCUS LLC, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/18 (2006.01); G06F 11/34 (2006.01); G06F 11/32 (2006.01); G09G 5/00 (2006.01); G06F 11/30 (2006.01);
U.S. Cl.
CPC ...
G06F 17/18 (2013.01); G06F 11/323 (2013.01); G06F 11/3409 (2013.01); G06F 11/3452 (2013.01); G09G 5/00 (2013.01); G06F 11/3089 (2013.01); G06F 11/3495 (2013.01); G06F 2201/81 (2013.01); G09G 2340/14 (2013.01);
Abstract

In one example of the disclosure, an expected measurement range is identified for each of a set of metrics. Actual value measurements are obtained for each of the metrics. Each of the identified expected measurement ranges and the actual value measurements are normalized according to a common scale. A graph is caused to be displayed. The graph includes a baseline band representative of the normalized measurement ranges, and includes the normalized actual value measurements plotted relative to the baseline band.


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