The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 05, 2020
Filed:
Jun. 08, 2017
International Business Machines Corporation, Armonk, NY (US);
Anthony T. Levas, Yorktown Heights, NY (US);
James W. Murdock, IV, Millwood, NY (US);
John M. Prager, Pomona, NY (US);
Benjamin P. Segal, Hyde Park, NY (US);
Timothy P. Winkler, Clinton, MA (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A mechanism is provided in a data processing system for using paraphrase metrics for answering questions. The mechanism receives an input question and generating a candidate answer from a corpus of information. The candidate answer has a supporting passage from the corpus of information. The mechanism divides the input question into a first sequence of tokens and divides the supporting passage into a second sequence of tokens. The mechanism identifies a plurality of subsequences of tokens within the second sequence of tokens and applies a paraphrase metric to compare the first sequence of tokens to each of the plurality of subsequences of tokens to generate a plurality of paraphrase metric scores. The mechanism then determines a confidence score for the candidate answer based on a highest paraphrase metric score within the plurality of paraphrase metric scores.