The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 05, 2020
Filed:
Oct. 31, 2016
Splunk Inc., San Francisco, CA (US);
David Ryan Marquardt, San Francisco, CA (US);
Hailun Yan, Sunnyvale, CA (US);
Christopher Pride, San Francisco, CA (US);
Vishal Patel, San Francisco, CA (US);
SPLUNK INC., San Francisco, CA (US);
Abstract
The disclosed embodiments include a method performed by a data intake and query system to store and query metrics data. The method includes ingesting metrics, where each metric includes key values and numerical value indicative of a measured characteristic of a computing resource. The method further includes populating a first portion of a metric-series index (msidx) file with the key values and a second portion of the msidx file with numerical values indicative of a measured characteristic, where the first portion is distinct from the second portion. The method further includes receiving a query including criteria, evaluating the query by applying the criteria to the first portion of the msidx file to obtain query results indicative of metrics that satisfy the criteria, and displaying, on a display device, the query results or data indicative of the query results.