The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 05, 2020

Filed:

Feb. 07, 2019
Applicant:

Fujitsu Limited, Kawasaki-shi, Kanagawa, JP;

Inventors:

Hiroaki Yoshida, Cupertino, CA (US);

Mukul R. Prasad, San Jose, CA (US);

Assignee:

FUJITSU LIMITED, Kawasaki, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 9/44 (2018.01); G06F 11/36 (2006.01);
U.S. Cl.
CPC ...
G06F 11/3624 (2013.01); G06F 11/3612 (2013.01); G06F 11/3664 (2013.01);
Abstract

According to an aspect of an embodiment, operations may include determining a plurality of event correspondences. Each event correspondence may indicate a correspondence between a respective change of a plurality of changes made to first source code of a first software program and a respective event type that occurs with respect to the first software program. The plurality of event correspondences may be determined by performing two or more event type inference operations of a plurality of event type inference operations. The plurality of event type inference operations may include determining a fault introduction event, determining a fault correction event, determining a defect introduction event, determining a defect correction event, and determining a platform migration event.


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