The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 05, 2020

Filed:

Aug. 11, 2015
Applicant:

Dell Products L.p., Round Rock, TX (US);

Inventors:

Dinesh Kunnathur Ragupathi, Round Rock, TX (US);

Timothy M. Lambert, Austin, TX (US);

Syama Poluri, Round Rock, TX (US);

Assignee:

Dell Products L.P., Round Rock, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/07 (2006.01); G06F 11/30 (2006.01);
U.S. Cl.
CPC ...
G06F 11/0754 (2013.01); G06F 11/0706 (2013.01); G06F 11/0757 (2013.01); G06F 11/3044 (2013.01); G06F 11/3058 (2013.01);
Abstract

In accordance with embodiments of the present disclosure, an information handling system may include a plurality of information handling resources and a controller communicatively coupled to the plurality of information handling resources. The controller may be configured to monitor for the presence of a thermal escape event of the information handling system. The controller may also be configured to, responsive to detecting the presence of the thermal escape event, determine one or more affected information handling resources of the plurality of information handling resources, wherein the one or more affected information handling resources comprise information handling resources thermally affected by the thermal escape event. The controller may further be configured to determine for each of the one or more affected information handling resources a respective thermal excursion timeout period.


Find Patent Forward Citations

Ragupathi, Dinesh. (2020). Systems and methods for dynamic thermal excursion timeout determination and predictive failure notification based on airflow escape detection (U.S. Patent No. 10642672). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10642672

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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