The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 05, 2020
Filed:
Dec. 08, 2016
The Regents of the University of Michigan, Ann Arbor, MI (US);
Thomas D. Wang, Ann Arbor, MI (US);
Haijun Li, Ann Arbor, MI (US);
Xiyu Duan, Ann Arbor, MI (US);
Zhen Qiu, Menlo Park, CA (US);
Kenn Oldham, Ann Arbor, MI (US);
THE REGENTS OF THE UNIVERSITY OF MICHIGAN, Ann Arbor, MI (US);
Abstract
An optical probe scanning assembly for use in an optical probe includes a mirror assembly that focuses an illumination beam path and a collection beam path at a region of interest within the sample. The illumination beam and the collection beam overlap to form a confocal beam region. The mirror assembly is movable in an x-axis direction and in a y-axis direction to scan the confocal beam region within the sample. The scanning assembly further includes a scanning suspension system including a gimbal assembly connected to the mirror assembly to allow the mirror assembly to rotate about one or more axes. The mirror is thereby adapted to scan along at least two different orthogonal planes, one of which extends vertically into the sample.