The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 05, 2020
Filed:
Apr. 23, 2015
Applicant:
Olympus Corporation, Shibuya-ku, Tokyo, JP;
Inventor:
Hisao Kitagawa, Hino, JP;
Assignee:
OLYMPUS CORPORATION, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/00 (2006.01); G02B 21/36 (2006.01); H04N 5/225 (2006.01); G02B 27/58 (2006.01); G01N 21/64 (2006.01);
U.S. Cl.
CPC ...
G02B 21/0076 (2013.01); G01N 21/6458 (2013.01); G02B 21/008 (2013.01); G02B 21/0044 (2013.01); G02B 21/0048 (2013.01); G02B 21/361 (2013.01); G02B 21/367 (2013.01); G02B 27/58 (2013.01); H04N 5/2254 (2013.01);
Abstract
A superior superresolution image can be generated. Provided is a specimen observation apparatus including an objective lens that radiates excitation laser light emitted from a light source onto a specimen; and a main controller that obtains a plurality of sets of image data of the same region on the specimen by repeatedly detecting fluorescence from the same region on the specimen irradiated with the excitation laser light by the objective lens, and that emphasizes high-frequency components in an addition image data obtained by adding the obtained plurality of sets of image data of the same region on the specimen.