The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 05, 2020

Filed:

May. 28, 2014
Applicant:

Datainfocom Usa, Inc., Austin, TX (US);

Inventors:

Frederick Johannes Venter, Driftwood, TX (US);

Atanu Basu, Austin, TX (US);

Assignee:

DataInfoCom USA, Inc., Austin, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G01V 9/00 (2006.01);
U.S. Cl.
CPC ...
G01V 9/00 (2013.01); G06K 9/00476 (2013.01);
Abstract

An exemplary method of analyzing a well log includes imaging a well log to form a well log image, performing pattern recognition on the well log image to determine pattern data, and determining stratigraphic structure data based on the pattern data. Another exemplary method of improving production from a stratigraphic structure includes performing pattern recognition on a well log image stored in an image format to determine pattern data, determining stratigraphic structure data using a computer-based structure analyzer based on the pattern data, and projecting well parameters based on the stratigraphic structure data. An exemplary system includes a scanner to scan a raster image of a printed well log and a computational system in communication with the scanner to receive the raster image. The computational system includes a pattern recognition analyzer to determine pattern data from the raster image and a structure analyzer to determine stratigraphic structure based on the pattern data.


Find Patent Forward Citations

Venter, Frederick. (2020). System and method for well log analysis (U.S. Patent No. 10641921). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10641921

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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