The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 05, 2020

Filed:

May. 30, 2013
Applicants:

Meir Israelowitz, Toronto, CA;

Herbert Peter Von Schroeder, Toronto, CA;

Syed Rizvi, Lake Mary, FL (US);

Chris Holm, Wuppertal, DE;

Christoph Gille, Hohen Herrendorf, DE;

Inventors:

Meir Israelowitz, Toronto, CA;

Herbert Peter von Schroeder, Toronto, CA;

Syed Rizvi, Lake Mary, FL (US);

Chris Holm, Wuppertal, DE;

Christoph Gille, Hohen Herrendorf, DE;

Assignee:

BIOMIMETICS TECHNOLOGIES, INC., Toronto, Ontario, CA;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01R 33/02 (2006.01); G01R 33/12 (2006.01);
U.S. Cl.
CPC ...
G01R 33/02 (2013.01); G01R 33/1269 (2013.01);
Abstract

The invention relates to a circuit or microchip for the detection of poor sources of (or very weak) electrical and/or magnetic fields. In one embodiment a device of the present invention includes a microchip consisting of a plate with a plurality of cells, each cell includes a crystal suspended in a semiconducting polymer and piece of metal wire. The cell is insulated by another polymer. A voltage is applied to parallel wires running on each side of the cell, thus inducing a first (or static, or initial) voltage when measured from the cell to the wire. Changes in magnetic or electrical fields are detected by noting a change in voltage from the cell, which is caused by the crystal changing orientation due to the change in the field the circuit is subjected to.


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