The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 05, 2020

Filed:

Oct. 16, 2015
Applicant:

Renault S.a.s., Boulogne-Billancourt, FR;

Inventors:

Fehd Ben-Aicha, Guyancourt, FR;

Do-Hieu Trinh, Fontenay-le-Fleury, FR;

Philippe Toussaint, Versailles, FR;

Assignee:

RENAULT s.a.s., Boulogne-Billancourt, FR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 19/00 (2018.01); G01R 31/367 (2019.01); G01R 31/382 (2019.01); G01R 31/392 (2019.01); H01M 10/48 (2006.01);
U.S. Cl.
CPC ...
G01R 31/367 (2019.01); G01R 31/382 (2019.01); G01R 31/392 (2019.01); H01M 10/48 (2013.01); H01M 2220/10 (2013.01);
Abstract

A method detects defects in an electrical power storage system including at least one battery. The method includes applying an instruction for charging or discharging the battery. The method also includes measuring the current passing through the battery during application of the instruction and calculating m×n mean errors (eTj(tij))1≤j≤m, 1≤i≤n between the measured current and the theoretical current of the instruction in m×n time intervals ([tij, tij+Tj])1≤j≤m, 1≤i≤n, respectively. The method also includes calculating, for each j between 1 and m, ej=max(eTj (tij)), where i=1, . . . , n. Lastly, the method includes incrementing a counter Cj if ej completely or partially exceeds a predetermined threshold. A defect is detected if Cj exceeds a predetermined threshold.


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